Work

Comparative study of aging-induced optical and electrical degradation and dynamic stability in GaN-on-sapphire and GaN-on-GaN micro-LEDs

Year: 2026

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0328148

Authors: Shan Huang, Zichun Li, Yibo Liu, Feng Feng, Jingyang Zhang, Xinyi Liu, Ruixiang Zhu, Yinan Zhang, Zhaoyong Liu, Fion Yeung, Manchun Tseng, Hoi Sing Kwok, Man Hoi Wong, Zhaojun Liu

Institutions: Hong Kong University of Science and Technology, Southern University of Science and Technology

Language: English

Topic: GaN-based semiconductor devices and materials

Subfield: Condensed Matter Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Innovation and Technology Fund

Award: Ultra-high PPI Micro-LED Display Key Technology Research and Development and Industrialization

OpenAlex ID: W7152971990

FWCI:

Cites: 21

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