Work

Type-II Band Alignment in Bi 2 Te 3 /Te Nanowires Enables High Sensitivity and Ultralow Dark Current for Broadband Polarization Imaging

Year: 2026

Type: article

Source: ACS Applied Nano Materials

DOI: 10.1021/acsanm.6c00842

Authors: Dechao Ji, Shian Mi, Yuhang Ma, Zehao Liu, Haibo Shu, Guanhai Li, Changlong Liu, Xiaoshuang Chen, Songyuan Ding

Institutions: University of Chinese Academy of Sciences, China Jiliang University, Chinese Academy of Sciences, Shanghai Institute of Technical Physics, State Key Laboratory of Infrared Physics

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Natural Science Foundation of Zhejiang Province

Awards: G4438576148, 面向通感一体化的太赫兹共口径多模式器件及其感知研究

OpenAlex ID: W7154163231

FWCI:

Cites: 30

Cited by:

Related to: