Work

Leakage-Induced Space-Charge Accumulation and Interfacial Field Redistribution in a Dielectric Nanocapacitor Revealed by Operando Electron Holography

Year: 2026

Type: article

Abstract: framework based on electron holography for probing nanoscale electrical properties and disentangling competing leakage mechanisms in advanced micro- and nanoscale capacitors.

Source: Nano Letters

DOI: 10.1021/acs.nanolett.6c00753

Authors: Bérangère Disic, Kilian Gruel, Aurélien Masseboeuf, Leifeng Zhang, Raphaël Serra, Martin Hÿtch, Christophe Gatel

Institutions: Centre National de la Recherche Scientifique, Centre d’Élaboration de Matériaux et d’Études Structurales, Université de Toulouse, Commissariat à l'Énergie Atomique et aux Énergies Alternatives, Spintronique et Technologie des Composants, Université Grenoble Alpes

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: green

Funders: European Commission, Agence Nationale de la Recherche, H2020 Research Infrastructures

Awards: G1140219906, Université Fédérale de Toulouse, G5913807706, Polarisation mapping by electron holography studies

OpenAlex ID: W7154189222

FWCI: 2.103

Cites: 47

Cited by: 1

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