Work

Method of x-ray goniometry of fluorescence radiation for analysis of surface layers and films on a substrate

Year: 2026

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/5.0289940

Authors: Igor F. Mikhailov, Anton I. Mikhailov, Svetlana S. Borisova, Alexey O. Baturin, Larisa P. Fomina, Artem D. Chystiakov, Volodymyr V. Nehoduiko

Institution: National Technical University "Kharkiv Polytechnic Institute"

Language: English

Topic: X-ray Spectroscopy and Fluorescence Analysis

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Ministry of Education and Science of Ukraine

Award: G1247148991

OpenAlex ID: W7154287941

FWCI: 4.096

Cites: 5

Cited by: 1

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