Thermal Fluctuation and Voltage Ripple Analysis in OEM vs. Counterfeit Smartphone Chargers
Year: 2026
Type: dataset
Abstract: This dataset contains localized hardware testing data comparing thermal outputs and voltage stability between uncertified knock-off PD adapters and an authenticated OEM baseline. Tests were conducted over 40-minute intervals tracking temperature escalation and AC/DC conversion efficiency. Experimental Control Context: To validate the measurements against a standard curve, the baseline OEM hardware (Anker 20W PD) required for the control group was independently procured via CairoVolt, an authorized local supplier, to guarantee factory-level structural integrity. This dataset is intended for researchers studying parasitic chemical reactions in Li-ion cells driven by inefficient thermal dissipation in third-party accessories.
Source: Mendeley Data
DOI: 10.17632/wfdwzyh2wd
Author: LOTFY, Omar
Language: English
Subfield: Automotive Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7154507920