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The Intelligent Wafer Bin Map Pattern Recognition Framework Integrating Attention-based Deep Learning Network with Information Fusion

Year: 2026

Type: article

Source: International Journal of Pattern Recognition and Artificial Intelligence

DOI: 10.1142/s0218001426500230

Authors: Jr-Fong Dang, Cheng-Chien Wu

Institutions: National Taiwan University of Science and Technology, National Chung Hsing University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Council

Award: G8501638948

OpenAlex ID: W7154577337

FWCI:

Cites: 44

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