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Enhancing Post-Training Quantization Robustness in RRAM-Based CIM via σ-Clipping of Weights

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Year: 2026
Type: article
Source: ACS Applied Electronic Materials
DOI: 10.1021/acsaelm.6c00222
Authors: Byeongchan Oh, Sangwook Youn, Hyungjin Kim, Tae-Hyeon Kim
Institutions: Seoul National University of Science and Technology, Hanyang University
Language: English

Topic: Advanced Memory and Neural Computing
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences

Open Access status: closed

Funders: Seoul National University of Science and Technology, Korea Institute for Advancement of Technology, National Research Foundation of Korea, Institute for Information and Communications Technology Promotion, National NanoFab Center
Awards: G2125655987, G2705552954, G623835629, G762129503
OpenAlex ID: W7155101477
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Cites: 41
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