Work

Emulation and Mitigation of Multiple Bit Upset in SRAM Memories Using Interleaved Counter Matrix Code

Year: 2026

Type: article

Source: Journal of Circuits Systems and Computers

DOI: 10.1142/s0218126626502245

Authors: M. Shunmugathammal, Anusha Gorantla, R. Dinesh, N. Muthukumaran, P. Deepa, A. Ahilan, T. V. Sindhu

Institutions: SRM Institute of Science and Technology, HKBK College of Engineering, Sri Eshwar College of Engineering, Government of Tamil Nadu, Vel Tech Rangarajan Dr. Sagunthala R&D Institute of Science and Technology

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7155168310

FWCI:

Cites: 19

Cited by:

Related to: