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Design and Experiment of a Double-Layer Orthogonal Photoelectric Through-Beam Detection Device for High-Throughput Wheat Seed Flow

Year: 2026
Type: article
Abstract: Aiming at the problems of mutual overlapping in high-throughput seed flow and difficulty in accurate detection of seeding rate during high-speed precision wheat seeding, a double-layer orthogonal through-beam photoelectric detection device for high-throughput wheat seed flow was developed in this paper, based on a four-layer staggered hook-type precision wheat seed-metering device. Combined with the least squares method for threshold optimization and an error compensation model, the detection accuracy was effectively improved. Bench test results show that the detection accuracy of the device is stable above 97% at medium and low seeding frequencies of 20–40 Hz, which can meet the requirements of conventional operations. When the seeding frequency increases to 80–120 Hz, the accuracy decreases to 89.05% due to the increase in seed flow density. After introducing the compensation model, the accuracy remains above 95% in the high-frequency range of 90.2–140.2 Hz, which is nearly 10 percentage points higher than that without compensation. The research results can provide effective support and a technical approach for the accurate online detection of high-frequency seed flow in high-speed precision wheat seeding.
Language: English
Open Access status: gold
Estimated APC paid: $1,930
OpenAlex ID: W7156826608
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Cites: 13
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