Work

Prediction of peeling defect in offset printing machines and discovery of the main causes of the defect

Year: 2026

Type: article

Source: Journal of Korean institute of intelligent systems

DOI: 10.5391/jkiis.2026.36.2.149

Authors: Byungki Kim, Chang-Ouk Kim

Language: English

Topic: Fault Detection and Control Systems

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7160179765

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