Electromagnetic Characterization of Electrically Thin Low-Loss Materials Through Uncalibrated Frequency-Domain Free-Space Measurements
Year: 2026
Type: article
Abstract: An extraction procedure is proposed for electrically thin (WWis the sample thickness andλis the wavelength) low-loss samples taking into account of an antenna error model. Different from previous models, the examined error model considers the more general case of networks for transmitting and receiving antennas with non-zero and non-identical reflection terms, arising due to impedance mismatches and ringing effects, which are hard to be eliminated for wideband frequency-domain measurements. An objective function free from all error network terms and reference plane transformation factors is first derived and then specialized for unique relative permittivity (εr) determination of electrically thin low-loss samples only. Our method produces multiple-solutions for thicker samples (W> λ/4). MinimumWand minimum and maximum εrvalues that our method is applicable are also analyzed. Sensitivity and uncertainty analyses were followed to examine the performance of our method. Free-space measurements of standard electrically thin low-loss Rogers 4350B and FR-4 samples were then performed over X-band (8.2 − 12.4 GHz) for validation of our method.
Authors: Ugur Cem Hasar, Huseyin Korkmaz, Yunus Kaya
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
Estimated APC paid: $2,645
OpenAlex ID: W7160193207