Work

Layer-specific porosity analysis in sub-nanoporous silica thin films using variable-energy positron annihilation lifetime technique, ellipsometric porosimetry, and attenuated total reflection infrared spectroscopy

Year: 2026

Type: article

Source: Review of Scientific Instruments

DOI: 10.1063/5.0294598

Authors: Shigeru Yoshimoto, Kenji Ito

Institutions: Toray Research Center, Inc. (Japan), National Institute of Advanced Industrial Science and Technology

Language: English

Topic: Muon and positron interactions and applications

Subfield: Mechanics of Materials

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

Awards: Developing an elucidation method for surface chemistry on subnanoscaled holes of functional thin films by positronium annihilation, Development of novel SiO2-based membranes and their application to catalytic membrane reactors for process intensification

OpenAlex ID: W7160652783

FWCI: 2.016

Cites: 29

Cited by: 1

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