Work

Memory-efficient Image Patch Distribution Modeling for Industrial Anomaly Detection

Year: 2026

Type: article

Source: Journal of the Korea Society of Computer and Information

DOI: 10.9708/jksci.2026.31.04.097

Authors: Ki-Ju Kim, Gye-Young Kim

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7160654666

FWCI:

Cites:

Cited by:

Related to: