High‐Quality Organic Doped Anthracene Crystal Wafer Scintillators for High‐Resolution X‐Ray Imaging
Year: 2026
Type: article
Source: Advanced Optical Materials
DOI: 10.1002/adom.71294
Institutions: Tianjin University, Fuzhou University
Language: English
Subfield: Radiation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Awards: G6259373361, G8649491874
OpenAlex ID: W7160845906
