Atomic-Level Surface of Copper Induced by Photocatalytic Chemical Mechanical Polishing with High Material Removal Rate under Visible Light Irradiation
Year: 2026
Type: article
Source: ACS Applied Electronic Materials
Language: English
Subfield: Biomedical Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Awards: G209082371, G5930720675, G7560254078
OpenAlex ID: W7160867674
