Year: 2026
Type: preprint
Abstract: Ultrafast diffraction is the cutting-edge technique to extract the atomic temperature at femtosecond timescales, and further related quantities - in particular, electron-phonon coupling strength at elevated electronic temperatures. The present work demonstrates limitations of such an analysis, emphasizing the importance of careful evaluation of the evolution of the Debye temperature. It is shown that, due to the sensitivity of the Debye-Waller analysis to this parameter, neglecting its changes under electronic excitation may lead to significant deviations of the atomic temperature extracted from its true values.
Source: arXiv (Cornell University)
Authors: Medvedev, N., Kopecky, M., Chalupsky, J., Juha, L.
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
Funder: European Commission
Awards: G6231593222, G6866058724, G941802975
OpenAlex ID: W7161265681
