Work

Direct Determination of 3C/4H Silicon Carbide Heterophase Interfaces by Electron Ptychography

Year: 2026

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.6c04617

Authors: Junghwa Kim, Katherine J. Harmon, F. Joseph Heremans, Nazar Delegan, Matthew J. Highland, Stephan O. Hruszkewycz, James M. LeBeau

Institutions: Massachusetts Institute of Technology, Argonne National Laboratory, University of Chicago, Advanced Photon Source

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

Funders: U.S. Department of Energy, Air Force Office of Scientific Research

Awards: G102163711, G7985812018

OpenAlex ID: W7161556207

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Cites: 54

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