Work

Design and Optimization of a Dynamic Test Platform for Automotive-Grade IGBT Module

Year: 2026

Type: article

Abstract: In the field of dynamic characteristic testing of automotive grade IGBT modules, high-frequency noise interference and stray inductance are universal technical challenges faced by the industry. High frequency noise and stray inductance can interfere with signal integrity, seriously reducing the testing accuracy of the platform and causing deviations in the dynamic characteristic evaluation of IGBT modules. To address this issue, this paper proposes a software hardware collaborative optimization strategy and designs a high-precision dynamic characteristic testing platform for automotive grade IGBT modules. At the software level, Savitzky–Golay filters are introduced and designed to process the test data, filter out high-frequency noise interference. After filtering, the noise mean square error and peak to peak value of the platform are generally reduced by 48–68%, and the switch ringing or peak value is reduced by about 45–53%. In terms of hardware optimization, an improved PCB laminated busbar was designed to reduce the overall stray inductance of the platform through simulation analysis of the structural parameters and via factors of the laminated busbar using ANSYS 2023 R1. The test results verification shows that the stray inductance of the testing platform is only 23 nH. The absolute error between the parameters measured by the testing platform and the reference values of the tested module is within 5%.

Source: Electronics

DOI: 10.3390/electronics15102188

Authors: Zhensheng Wang, Xiaofeng Hu, Han Yan, Bin Guo, Jiajun Wu, Yi Lu

Institution: China Jiliang University

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: gold

Estimated APC paid: $2,896