Photoluminescence of resin-based solder flux residue under ultraviolet excitation from 120 nm to 310 nm
Year: 2026
Type: preprint
Abstract: Nuisance photoluminescence is a potential source of background in particle detectors that use noble liquids as target material for galactic dark matter particles and neutrinos. Liquid argon and xenon scintillate in the vacuum ultraviolet (VUV) wavelength range in response to particle interactions. Photoluminescent materials that absorb these photons can cause unexpected signals that may impede event reconstruction in these detectors. We illuminated residue from different types of commercial solder flux commonly used in liquid xenon detectors with ultraviolet and VUV light and measured their photoluminescence spectra and intensities. We find that all tested flux residues photoluminesce in the visible spectral region when exposed to VUV light.
Source: arXiv (Cornell University)
Language: English
Subfield: Nuclear and High Energy Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: green
Funder: Deutsche Forschungsgemeinschaft
OpenAlex ID: W7161697194
