Work

Electrical Physically Unclonable Function via Stochastic-Defect-Driven Invisible Current Pathways

Year: 2026

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.6c05829

Authors: Changgyun Moon, Seonghoon Jeong, Joo-On Oh, Myat Thet Khine, Yanji Piao, Jeonghyun Kim, Srinivas Gandla, Sunkook Kim

Institutions: Sungkyunkwan University, National Institute of Technology Warangal

Language: English

Topic: Physical Unclonable Functions (PUFs) and Hardware Security

Subfield: Hardware and Architecture

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

Funders: Korea Basic Science Institute, National Research Foundation of Korea

Awards: G3312332093, G5001564797

OpenAlex ID: W7162564023

FWCI:

Cites: 49

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