Work

NMR characterization of thin films

Year: 2008

Type: article

Abstract: A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.

Source: University of Chicago

DOI: 10.6082/3jy5f-cs694

Authors: Gerald II, Rex E., Klingler, Robert J., Rathke, Jerome W., Diaz, Rocio, Vukovic, Lela

Institution: University of Chicago

Language: English

Topic: NMR spectroscopy and applications

Subfield: Nuclear and High Energy Physics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W7163027105

FWCI:

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