Interfacial Oxygen Migration Underlies Performance Limitations in High‐Loading Aluminum‐Ion Batteries
Year: 2026
Type: article
Source: ChemSusChem
DOI: 10.1002/cssc.70763
Authors: Suchita Kandpal, Samuel Agyei Baffour, Shuo Jin, Lynden A. Archer
Institution: Cornell University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7163063725
