Work

Strain Induced Bandgap Engineering in Wafer‐Scale Hexagonal Boron Nitride Thick Epitaxial Films for Broadband Solar‐Blind Ultraviolet Detection

Year: 2026

Type: article

Source: Advanced Optical Materials

Authors: Runzhi An, Xiang Fang, Wencan Yao, Danni Zhao, Zhongyuan Han, Ze Long, Hongwei Liang, Hong Yin

Institutions: Jilin University, State Key Laboratory of High Pressure and Superhard Materials, Dalian University of Technology

Language: English

Topic: 2D Materials and Applications

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G4128926312

OpenAlex ID: W7164675558

FWCI: 2.893

Cites: 49

Cited by: 2

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