Work

Coherent Structured Illumination Microscopy with Enhanced Suppression of Coherent Defocus Artifacts

Year: 2026

Type: article

Abstract: Coherent structured illumination microscopy (c-SIM) is a synthetic aperture optical technique for sub-diffraction limit imaging that extends the utility of traditional SIM to non-fluorescent samples. Here, we present a complementary 5-beam implementation of c-SIM that provides enhanced optical sectioning compared to conventional quadrupolar illumination. Since our approach detects intensity images due to coherent light scattering, it avoids the complications associated with detecting complex fields. Through comparative measurements on calibration samples and live microalgae, we show that 5-beam c-SIM effectively suppresses coherent defocus effects, improving image quality while simultaneously providing a 2-fold lateral resolution improvement.

Source: Optics Express

DOI: 10.1364/oe.607016

Authors: Kevin Crampton, Alan Joly, Long Nguyen, Saleem Iqbal, Robert Boyd, James Evans

Institutions: Pacific Northwest National Laboratory, Environmental Molecular Sciences Laboratory, University of Rochester, University of Ottawa

Language: English

Topic: Advanced Fluorescence Microscopy Techniques

Subfield: Biophysics

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: gold

Estimated APC paid: $2,270