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Atomic-Resolution Mapping of Electric Fields and Strain across Single-Crystalline/Amorphous Interfaces

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Year: 2026
Type: article
Source: Nano Letters
DOI: 10.1021/acs.nanolett.6c01302
Authors: Jun Zhao, Zanlin Qiu, Yuan Meng, Yan Li, Alex V. Trukhanov, Wenshuo Xu, Xiaoxu Zhao
Institutions: Peking University, National Academy of Sciences of Belarus, University of Cambridge
Language: English

Topic: Advanced Electron Microscopy Techniques and Applications
Subfield: Structural Biology
Field: Biochemistry, Genetics and Molecular Biology
Domain: Life Sciences

Open Access status: closed

Funders: European Commission, National Natural Science Foundation of China, China Postdoctoral Science Foundation, Engineering and Physical Sciences Research Council, National Key Research and Development Program of China Stem Cell and Translational Research
Awards: G3431863775, G3888264465, G4641700274, Metal Atoms on Surfaces & Interfaces (MASI) for Sustainable Future, G5635269178
OpenAlex ID: W7165002053
FWCI:
Cites: 63
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