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Intent-Aware Defect Pattern Extraction from Singular Examples

Year: 2026

Type: article

Source: ACM Transactions on Software Engineering and Methodology

DOI: 10.1145/3820049

Authors: Jiachen Han, Fengjie Li, Jiajun Jiang, Ruihang Fan, Yingfei Xiong, Linjie Pan, Bilian Wang, Junjie Chen

Institutions: Tianjin University, Peking University, Huawei Technologies (China)

Language: English

Topic: Software Engineering Research

Subfield: Information Systems

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7165883960

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Cites: 36

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