Open-Circuit Fault Diagnosis Method for Single-Phase Cascaded H-Bridge Rectifier Considering Phase-to-Phase Surge Impacts
Year: 2026
Type: conference-paper
Abstract: To address the misdiagnosis issue of IGBT open-circuit faults caused by phase separation transients in the single-phase cascaded H-bridge rectifier (SPCHBR), a real-time diagnosis method based on a post-fault voltage residual model is proposed. Firstly, a mixed logical dynamical (MLD) model of the SPCHBR is established to generate voltage residuals. Subsequently, the impact mechanism of phase separation transients on grid-side electrical quantities is analyzed in depth, revealing the unique current paths and topological evolution laws following an IGBT open-circuit fault. On this basis, a post-fault voltage residual model is constructed, which effectively characterizes the distinctions between fault states and transient impacts in terms of residual time-domain characteristics. By setting appropriate thresholds, the accurate detection and localization of single and multiple IGBT faults are achieved. The proposed method requires no additional sensors, utilizing only internal signals from the control system for rapid diagnosis, and exhibits strong robustness against variations in operating conditions. Experimental results verify the effectiveness and reliability of the proposed strategy under complex phase separation conditions.
Authors: Xi Huang, Dong Xie, Meiqi Wang, Xinglai Ge
Institution: Southwest Jiaotong University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: hybrid
OpenAlex ID: W7166658459