Work

Integrated PCB and Epoxy Defect Inspection System Using a Domain Classification-Based Three-Stage YOLO11 Model

Year: 2026

Type: article

Source: Journal of Korean institute of intelligent systems

DOI: 10.5391/jkiis.2026.36.3.285

Authors: So-Jeong Kim, Hyun-Jung Hwang, Jae-Hoon Cho, Yong-Tae Kim

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7166665726

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