Work

Electro-Thermal Characterization of Conductive Filament in Vanadium Dioxide Memristors Using Thermoreflectance Imaging

Year: 2026

Type: article

Source: ACS Applied Electronic Materials

DOI: 10.1021/acsaelm.6c00533

Authors: Thomas Ratier, Martin Vanbrabant, Xi Zeng, Loïc Lahaye, Jean-Pierre Raskin, Denis Flandre

Institution: UCLouvain

Language: English

Topic: Advanced Memory and Neural Computing

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7169590336

FWCI: 1.715

Cites: 37

Cited by: 1

Related to: