Profile evolution and mechanisms in pulsed-bias plasma etching of high-aspect-ratio silicon pillars for wafer-scale metasurface manufacturing
Year: 2026
Type: article
DOI: 10.1116/6.0005573
Institution: Zhejiang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Funder: Zhejiang University
OpenAlex ID: W7170048059
