Work

Event-Driven Short-Circuit Fault Classification in SCIG with Confidence-Weighted Aggregation

Year: 2026

Type: conference-paper

Source: International Conference on Electronics, Computers and Artificial Intelligence (ECAI)

DOI: 10.1109/ecai69016.2026.11613617

Authors: Hüseyin Tayyer Canseven, Evin Şahin Sadık

Institutions: Lappeenranta-Lahti University of Technology, Kütahya Dumlupınar Üniversitesi

Language: English

Topic: Machine Fault Diagnosis Techniques

Subfield: Control and Systems Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7170848992

FWCI: 18.29

Cites: 17

Cited by: 1

Related to: 10