A thickness-dependence study on structure, oxidation, and critical temperature scaling of α -Ta(111) thin films for qubit application
Year: 2026
Type: article
Source: AVS Quantum Science
DOI: 10.1116/5.0332825
Institutions: Miami University, Centro de Investigación Científica y de Educación Superior de Ensenada, University of Cincinnati, United States Air Force Research Laboratory, Wright-Patterson Air Force Base, Wright Laboratory, U.S. Air Force Research Laboratory Materials and Manufacturing Directorate, Universidad Nacional Autónoma de México
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W7171830003
