Reconfigurable interferometric form and mid-spatial frequency metrology for extended reality freeform optics
Year: 2026
Type: article
Abstract: This work presents a reconfigurable interferometric null test for precision measurement of form and mid-spatial-frequency (MSF) surface errors in rectangular freeform mirrors using a spatial light modulator (SLM) as a reconfigurable nulling element. A custom alignment strategy, optomechanical null test assembly, and metrology process chain enable repeatable interferometric measurements of high base-curvature and stress-sensitive polymer optics. Measurements on a representative near-eye display mirror show form-error repeatability within 60 nm in peak-to-valley and 19 nm in RMS values. MSF signatures are analyzed through spatial-frequency filtering and validated against a fixed computer-generated hologram (CGH), showing agreement within a 4.6 nm noise floor. This work further highlights the limitations of fixed CGH technology in managing straylight in small, high base-curvature parts, compared with reconfigurable SLM-based null tests. The demonstrated metrology process provides a pathway toward reconfigurable, high-precision testing of rectangular freeform optics for emerging extended reality technologies.
Source: Optics Express
DOI: 10.1364/oe.605857
Authors: Renuka Manjula Narayanan, Aaron Bauer, Chi Zhang, Matthew M. Ferguson, Anes Macić, Michael Pomerantz, Jie Qiao, Romita Chaudhuri, Jannick P. Rolland
Institutions: Rochester Institute of Technology, ASML (Netherlands)
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $2,270
Funder: National Science Foundation
Awards: IUCRC Phase III University of Rochester: Center for Freeform Optics (CeFO), Phase II IUCRC at University of Rochester: Center for Freeform Optics, Phase II IUCRC at University of North Carolina, Charlotte: Center for Freeform Optics (CeFO), IUCRC Phase III University of North Carolina at Charlotte: Center for Freeform Optics (CeFO)
OpenAlex ID: W7172394570
