Work

Simultaneous measurement of complex refractive index and thickness of atomic-layer materials by surface plasmon resonance holographic microscopy

Year: 2026

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0347564

Authors: Yujie Zhang, Jiahao Li, Siqing Dai, Jiwei Zhang, Xuetao Gan, Jianlin Zhao

Institutions: Northwestern Polytechnical University, Ministry of Industry and Information Technology

Language: English

Topic: Plasmonic and Surface Plasmon Research

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Fundamental Research Funds for the Central Universities

Awards: G1446986647, G2911196419, G5963890953, G8629349120

OpenAlex ID: W7203662507

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Cites: 48

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