DEF-RSFA: an integrated nondestructive testing and reliability-aware SRAM design with fault analysis for additive manufacturing
Year: 2026
Type: article
Authors: Ze He, Jiao Liu, Mandula Huhe, Junfeng Ge, Xiaofei Xue, Wenhui Ji
Institution: Jining Normal University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7203725333