Heterogeneous Step-Stress Model for Type-I Censored Exponential Lifetime Under Continuous and Interval Monitoring
Year: 2026
Type: article
Source: IEEE Transactions on Reliability
Authors: Yao Lu, Maria Kateri
Institution: RWTH Aachen University
Subfield: Statistics and Probability
Field: Mathematics
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7203794375
