All‐Inside Meniscus Repair Systems Failure Analysis Shows Device‐Related Adverse Events Differ by Device Design Type and Show Varied Reporting Delays by Manufacturer
Year: 2026
Type: article
DOI: 10.1002/arj.70453
Authors: Tzadok Yona, Bhavya Sheth, Noam Reshef, Ron Gilat
Language: English
Subfield: Surgery
Field: Medicine
Domain: Health Sciences
Open Access status: closed
OpenAlex ID: W7203890988
