Experimental determination of electron and hole impact ionization coefficients in GaN avalanche photodiodes
Year: 2026
Type: article
Source: Applied Physics Letters
DOI: 10.1063/5.0340806
Authors: Xuzhi Zhao, Haifan You, Haiping Wang, Feiyu Zhang, Zhan Ma, Jiandong Ye, Bin Liu, Hai Lu, Rong Zhang, Youdou Zheng, Dunjun Chen
Institutions: Nanjing University, Nanjing Institute of Technology
Language: English
Subfield: Condensed Matter Physics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
Awards: G17044294, G8097361407
OpenAlex ID: W7204142014