Work

Leakage Failure Probability Optimization for Secured xURLLC in Mission Critical Applications

Year: 2026

Type: conference-paper

Source: IEEE International Symposium on Information Theory (ISIT)

DOI: 10.1109/isit62367.2026.11654152

Authors: Yinglei Yang, Di Zhang, Jinseok Choi, Bo Gu

Institutions: Zhengzhou University, Sun Yat-sen University, Korea Advanced Institute of Science and Technology

Topic: Low-power high-performance VLSI design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7204173415

FWCI:

Cites: 27

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