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Deep learning attention-based smart surveillance for automatic exam cheating detection

Year: 2026

Type: article

Source: African Journal of Science Technology Innovation and Development

DOI: 10.1080/20421338.2026.2696943

Authors: Yuvarani Sadatcharam, Dinakaran Muruganadam

Institution: Vellore Institute of Technology University

Language: English

Topic: Academic integrity and plagiarism

Subfield: Safety Research

Field: Social Sciences

Domain: Social Sciences

SDG: Quality education

Open Access status: closed

OpenAlex ID: W7204196843

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Cites: 28

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