Work

Hot-Carrier Lifetime Prediction of P-Channel MOSFETs in the Subthreshold Region

Year: 2026

Type: article

Source: JSTS Journal of Semiconductor Technology and Science

DOI: 10.5573/jsts.2026.26.4.283

Authors: Yoon Tae Jeong, Jae Seung Woo, Jin Ho Chang, Hye Sun Sung, Hyo Jung Kim, Seung Bo Shim, Woo Young Choi

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W7204214322

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