Adaptive Remaining Useful Life Prediction of Parallel DC ‐Link Capacitor Banks Considering Thermally Coupled Degradation
Year: 2026
Type: article
DOI: 10.1002/tee.70419
Authors: Weiwei Wang, Shengxue Tang
Institution: Hebei University of Technology
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W7204225793