Year: 2026
Type: article
Abstract: The rapid development of stealth technologies and electromagnetic interference (EMI) suppression systems has created an urgent need for radar‐absorbing materials with broadband and wide‐angle stability in the C and X bands. However, conventional absorbers are limited by inadequate impedance matching, high reflection loss, and complex fabrication processes. To address these issues, this study proposes a broadband metamaterial absorber based on resistive films. The structure is constructed by alternately arranging three layers of resistive films and three layers of SiO 2 dielectric substrates from top to bottom, which has a metallic backing plate placed at the bottom. Although the patterns of the three resistive films are all designed as square apertures, the structural parameters of each layer are optimized independently, resulting in different dimensions. Simulations show good polarization insensitivity from 0° to 80° under both TE and TM modes. Incident angle stability is maintained within 0°–45° under TE mode and 0°–65° under TM mode. Equivalent circuit analysis reveals that the synergistic effect of Ohmic loss and polarization loss enables over 90% absorptivity from 4 to 12 GHz. Therefore, the proposed metamaterial absorber provides a feasible pathway for broadband, wide‐angle stealth and EMI suppression in the C and X bands.
Source: physica status solidi (a)
DOI: 10.1002/pssa.70499
Authors: Hao Li, Huajun Liu, Mengke Qiao, Xiangcheng Li
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W7204271425