Work

Non-zero numerical aperture-corrected data analysis for imaging ellipsometry

Year: 2026

Type: article

Source: Journal of Applied Physics

DOI: 10.1063/5.0340518

Authors: Y. Harada, T. Inoue, D. Yamaguchi, E. Kondoh, Y. Mizutani, B. Gelloz, L. Jin

Institutions: Centre National de la Recherche Scientifique, Inserm, Physique pour la médecine Paris, University of Yamanashi, ESPCI Paris, The University of Osaka, Nagoya University

Language: English

Topic: Optical Polarization and Ellipsometry

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Japan Society for the Promotion of Science

Award: High speed and high precision Mueller matrix polarization fingerprint microscope

OpenAlex ID: W7204477046

FWCI:

Cites: 26

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