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Toward smart and adaptive apparel manufacturing: pattern-driven genetic algorithm optimization for modular garment assembly

Year: 2026

Type: article

Source: International Journal of Clothing Science and Technology

DOI: 10.1108/ijcst-01-2026-0029

Authors: Eung Tae Kim, Sungmin Kim

Institutions: Chungnam National University, Seoul National University

Language: English

Topic: Assembly Line Balancing Optimization

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W7204496935

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Cites: 15

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