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Practical Guide to Analyzing Dynamics Using X-ray Photon Correlation Spectroscopy (XPCS)

Year: 2026

Type: article

Abstract: X-ray photon correlation spectroscopy (XPCS) provides access to nanoscale dynamics, yet practical approaches for interpreting its data remain limited. This tutorial presents a systematic framework for XPCS data analysis, illustrated using measurements performed at the NSLS-II CHX beamline. The fundamental concepts of speckle pattern and the intensity autocorrelation function are introduced, followed by ferroelectric case studies demonstrating how polarization switching and phase transition dynamics can be extracted from XPCS measurements. The influence of the probed q-range experimental conditions such as X-ray transmittance is examined for data interpretation. These elements are consolidated into practical guidelines for the reliable analysis of XPCS data.

Source: Journal of the Korean Institute of Electrical and Electronic Material Engineers

DOI: 10.4313/jeem.2026.39.5.3

Authors: Jeong-Woo Sun, Jong Eun Ryu, Wook Jo

Institutions: Georgia Institute of Technology, North Carolina State University, Ulsan National Institute of Science and Technology

Language: English

Topic: Advanced X-ray Imaging Techniques

Subfield: Radiation

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: diamond