Year: 2026
Type: preprint
Abstract: Resistive random access memory (RRAM) devices, also known as memristors, are highly dependent on fabrication, location on the wafer, and measurement protocols. However, openly available large-scale memristor datasets remain scarce, particularly those that combine experimental metadata with electrical measurements and preserve explicit links across the experimental workflow. Here, we present a comprehensive relational database of automated electrical characterization data from oxide-based memristors. The database links 6,190 memristor devices across TiN/HfOx/TiN, Pt/TiOx/AlOy/Pt, and Pt/TiOx/Pt stacks to 161,006 validated experiments and over 169 million electrical point records. It integrates fabrication, wafer mapping, electrical characterization, and modeling to describe electroforming, current-voltage non-linearity, memory windows (R_off/R_on), switching dynamics, and short-term volatility. Released as a normalized and indexed SQLite database with schema documentation, graphical user interfaces, and examples of empirical modeling, this resource supports provenance-aware querying, statistical analysis, and data-driven applications for the development of future memristor technologies.
Source: arXiv (Cornell University)
Institution: University of Edinburgh
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W7206169375