Stack-height-aware thermal management of HBM packages via selective NCF thermal conductivity strategy
Year: 2026
Type: article
Source: Microelectronics Reliability
Authors: Yuna Lee, Jeong Hun Song, Sang Won Yoon
Institution: Seoul National University
Language: English
Topic: 3D IC and TSV technologies
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G2071672893
OpenAlex ID: W7208757966
