Work

Quantifying Microscale Gain in Photorefractive Semiconductors by Transient White-Light Interferometry

Year: 2026

Type: article

Source: ACS Nano

DOI: 10.1021/acsnano.6c09450

Authors: Chuanxiu Jiang, Wenna Du, Shuai Yue, Xinyu Sui, Shuai Zhang, Xiaotian Bao, Shaoli Wang, Jianwei Ding, Xianxin Wu, Yiyang Gong, Yuexing Xia, Yutong Zhang, Xin Zeng, Yuyang Zhang, Xiaohui Qiu, Qing Zhang, Xinfeng Liu

Institutions: Peking University, National Center for Nanoscience and Technology, University of Chinese Academy of Sciences, Weifang University, Chinese Academy of Forestry, Nankai University

Language: English

Topic: Photorefractive and Nonlinear Optics

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China, National Science Fund for Distinguished Young Scholars

Awards: G1705993985, G5407790516, G8902855809, G962040432

OpenAlex ID: W7208768433

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Cites: 80

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