Work

Total dose effects on operational amplifiers with MOSFET input

Year: 2026

Type: article

Source: Radiation effects and defects in solids

DOI: 10.1080/10420150.2026.2721518

Authors: S. Carbonetto, G. Salaya, A. Faigón, L. Sambuco Salomone, E. Redin, M. Garcia-Inza

Institutions: Consejo Nacional de Investigaciones Científicas y Técnicas, Universidad de Buenos Aires, National Technological University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: Universidad de Buenos Aires, Agencia Nacional de Promoción de la Investigación, el Desarrollo Tecnológico y la Innovación

Awards: G4779359877, G5387635068, G6336203182

OpenAlex ID: W7208769664

FWCI:

Cites: 33

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